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SN74BCT8374ADWR

  • SN74BCT8374ADWR
  • SN74BCT8374ADWR

SN74BCT8374ADWR

SN74BCT8374ADWR

Texas Instruments

IC SCAN TEST DEVICE W/FF 24-SOIC

SN74BCT8374ADWR Datasheet

non-compliant

SN74BCT8374ADWR Pricing & Ordering

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Name Value
Product Status Obsolete
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount
Package / Case 24-SOIC (0.295", 7.50mm Width)
Supplier Device Package 24-SOIC
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